NplusT’s TESTMESH is the new engineering tester platform, based on a breakthrough architecture concept.
NplusT 的 TESTMESH 是新的工程测试仪平台，基于突破性的架构概念。
The members of the TESTMESH family represent high-performance, ready-to-start, all-in-one instruments for the development and engineering of novel non-volatile memory technologies.
TESTMESH 系列的成员代表了高性能、随时可用的一体化仪器，用于新型非易失性存储器技术的开发和工程设计。
Based on the technology development stage, TESTMESH offers several optimized configurations.
根据技术发展阶段，TESTMESH提供了多种优化配置。

The hardware and software resources of the TESTMESH instruments support:
TESTMESH 仪器的硬件和软件资源支持：

• Extremely fast algorithmic cycling
  极快的算法循环
• Increased visibility on the cell and array status, characteristics and behavior
  提高单元和阵列状态、特性和行为的可见性
• Productivity of the technology and product engineers.
  技术和产品工程师的生产力。

These features are obtained by:
这些特征是通过以下方式获得的：

• Algorithmic, 200MHz waveform generators with dynamic impedance control and with pulse selection in microseconds
  算法 200MHz 波形发生器，具有动态阻抗控制和微秒级脉冲选择功能
• Fast current sensing circuits with setup time below microsecond and sampling speed in the dozens of nanosecond domain
  快速电流感应电路，设置时间低于微秒，采样速度在数十纳秒范围内
• Current measurement range switch time in microseconds, essential to obtain write pulses and suitable read scales
  电流测量范围切换时间（以微秒为单位），对于获得写入脉冲和合适的读取范围至关重要
• Threshold-programmable one-bit ADC to detect if the cell reached the desired state (sense amplifier emulation)
  阈值可编程一位 ADC，用于检测单元是否达到所需状态（感应放大器仿真）
• Flexible, programmable hardware sequencer to reduce the interaction with the software
  灵活、可编程的硬件定序器，以减少与软件的交互
• Wafer and package level testing
  晶圆和封装级测试
• Graphical user interface with engineering and operator modes, editor for waveforms, cycles and flows
  图形用户界面，具有工程和操作模式、波形、周期和流量编辑器
• Python and C++ programmability
  Python 和 C++ 可编程性
• Seamless integration with BarnieMAT, array data analysis software
  与阵列数据分析软件 BarnieMAT 无缝集成